HEYNS Marc | IMEC, Kapeldreef
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概要
関連著者
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HEYNS Marc
IMEC, Kapeldreef
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HEYNS Marc
IMEC
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Verhaverbeke S
Imec Kapeldreef
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Heyns Marc
Interuniversity Microelectronics Centre
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Alay Josep-lluis
Imec Kapeldreef : Lcmm Universitat De Barcelona
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Heyns M
Imec Leuven Bel
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Houssa Michel
Department Of Physics Katholieke Universiteit Leuven
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Stesmans Andre
Departement Natuurkunde Katholieke Universiteit Leuven
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ALAY Josep-Lluis
IMEC, Kapeldreef
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VERHAVERBEKE Steven
IMEC, Kapeldreef
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VANDERVORST Wilfried
IMEC, Kapeldreef
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Vandervorst W
Insys Leuven Bel
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ROOYACKERS Rita
IMEC, Advanced Semiconductor Processing Division
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Groeseneken Guido
imec, Kapeldreef 75, B-3001 Leuven, Belgium
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Naili Mohamed
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Gendt Stefan
imec, Kapeldreef 75, B-3001 Leuven, Belgium
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Mertens Paul
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Bearda Twan
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Holsteyns Frank
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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De Bisschop
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Compen René
ASML, De Run 6501, 5504 DR Veldhoven, The Netherlands
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van Meer
ASML, De Run 6501, 5504 DR Veldhoven, The Netherlands
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Houssa Michel
Department of Physics, Katholieke Universiteit Leuven, Celestijnenlaan 200 D, B-3001 Leuven, Belgium
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Heyns Marc
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Rooyackers Rita
imec, Kapeldreef 75, B-3001 Leuven, Belgium
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Leonelli Daniele
imec, Kapeldreef 75, B-3001 Leuven, Belgium
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Vandooren Anne
imec, Kapeldreef 75, B-3001 Leuven, Belgium
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Verhulst Anne
imec, Kapeldreef 75, B-3001 Leuven, Belgium
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Compen René
ASML, De Run 6501, 5504 DR Veldhoven, The Netherlands
著作論文
- Critical Parameters for Obtaining Low Particle Densities on a Si Surface in an HF-Last Process
- Silicide Engineering to Boost Si Tunnel Transistor Drive Current
- Charge Trapping in SiOx/ZrO2 and SiOx/TiO2 Gate Dielectric Stacks
- The Effect of Backside Particles on Substrate Topography