Stesmans Andre | Departement Natuurkunde Katholieke Universiteit Leuven
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概要
関連著者
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Stesmans Andre
Departement Natuurkunde Katholieke Universiteit Leuven
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Visalli Domenica
Department Of Physics University Of Leuven
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Nguyen Anh
Department Of Radiology Paediatric Hospital No. 1
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Simoen Eddy
Imec
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Houssa Michel
Department Of Physics Katholieke Universiteit Leuven
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HEYNS Marc
IMEC, Kapeldreef
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Stesmans Andre
Department Of Physics University Of Leuven
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VISALLI Domenica
Department of Physics, University of Leuven
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VAN HOVE
Imec
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LEYS Maarten
Imec
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DERLUYN Joff
Imec
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SRIVASTAVA Puneet
Imec
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GEENS Karen
Imec
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DEGROOTE Stefan
Imec
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GERMAIN Marianne
Imec
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BORGHS Gustaaf
Department of Physics, University of Leuven
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Borghs Gustaaf
Department Of Physics University Of Leuven
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Nguyen Anh
Department Of Physics University Of Leuven
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Leys Maarten
IMEC, Kapeldreef 75, 3001 Leuven, Belgium
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Borghs Gustaaf
Department of Physics and Astronomy, Katholieke Universiteit, 3001 Leuven, Belgium
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Naili Mohamed
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Houssa Michel
Department of Physics, Katholieke Universiteit Leuven, Celestijnenlaan 200 D, B-3001 Leuven, Belgium
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Heyns Marc
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Simoen Eddy
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Van Hove
Imec, Kapeldreef 75, 3001 Leuven, Belgium
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Derluyn Joff
Imec, Kapeldreef 75, 3001 Leuven, Belgium
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Srivastava Puneet
Imec, Kapeldreef 75, 3001 Leuven, Belgium
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Geens Karen
Imec, Kapeldreef 75, 3001 Leuven, Belgium
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Degroote Stefan
Imec, Kapeldreef 75, 3001 Leuven, Belgium
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Germain Marianne
Imec, Kapeldreef 75, 3001 Leuven, Belgium
著作論文
- On the Derivation of the Surface Spin-Flip Probability from Transmission-Electron Spin Resonance in Copper
- Investigation of Light-Induced Deep-Level Defect Activation at the AlN/Si Interface
- Investigation of Light-Induced Deep-Level Defect Activation at the AlN/Si Interface
- Charge Trapping in SiOx/ZrO2 and SiOx/TiO2 Gate Dielectric Stacks