Simoen Eddy | IMEC, Kapeldreef 75, B-3001 Leuven, Belgium

スポンサーリンク

概要

関連著者

もっと見る

著作論文

Investigation of Light-Induced Deep-Level Defect Activation at the AlN/Si Interface
Impact of Radiation-Induced Back-Channel Leakage and Back-Gate Bias on Drain Current Transients of Thin-Gate-Oxide Partially Depleted Silicon-On-Insulator n-channel Metal–Oxide–Semiconductor Field-Effect Transistors
Effective Work Function Engineering for Aggressively Scaled Planar and Multi-Gate Fin Field-Effect Transistor-Based Devices with High-k Last Replacement Metal Gate Technology
Deep Levels in High-Temperature 1 MeV Electron-Irradiated n-Type Czochralski Silicon

スポンサーリンク