Claeys Cor | IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
スポンサーリンク
概要
関連著者
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Rafi Joan
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Claeys Cor
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Simoen Eddy
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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NEIMASH Vlad
Institute of Physics, National Academy of Science of Ukraine
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KRAITCHINSKII Anatolii
Institute of Physics, National Academy of Science of Ukraine
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TISCHENKO Valerii
Institute of Physics, National Academy of Science of Ukraine
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VOITOVYCH Vasyl
Institute of Physics, National Academy of Science of Ukraine
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VERSLUYS Jorg
Department of Solid-State Sciences, Ghent University
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CLAUWS Paul
Department of Solid-State Sciences, Ghent University
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Clauws Paul
Department of Solid-State Sciences, Ghent University, Krijgslaan 281 S1, B-9000 Gent, Belgium
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Voitovych Vasyl
Institute of Physics, National Academy of Science of Ukraine, Kiev, Ukraine
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Tischenko Valerii
Institute of Physics, National Academy of Science of Ukraine, Kiev, Ukraine
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Kraitchinskii Anatolii
Institute of Physics, National Academy of Science of Ukraine, Kiev, Ukraine
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Simon Eddy
IMEC, Kapeldreef 75, B-3001 Leuven, Belgium
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Rafí Joan
IMEC, Kapeldreef 75, Leuven B-3001, Belgium
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Hayama Kiyoteru
IMEC, Kapeldreef 75, Leuven B-3001, Belgium
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Mercha Abdelkarim
IMEC, Kapeldreef 75, Leuven B-3001, Belgium
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Simoen Eddy
IMEC, Kapeldreef 75, Leuven B-3001, Belgium
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Versluys Jorg
Department of Solid-State Sciences, Ghent University, Krijgslaan 281 S1, B-9000 Gent, Belgium
著作論文
- Impact of Radiation-Induced Back-Channel Leakage and Back-Gate Bias on Drain Current Transients of Thin-Gate-Oxide Partially Depleted Silicon-On-Insulator n-channel Metal–Oxide–Semiconductor Field-Effect Transistors
- Deep Levels in High-Temperature 1 MeV Electron-Irradiated n-Type Czochralski Silicon