Rafí Joan | IMEC, Kapeldreef 75, Leuven B-3001, Belgium

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概要

• Rafi Joan Marcの詳細を見る
• 同名の論文著者
• IMEC, Kapeldreef 75, Leuven B-3001, Belgiumの論文著者

関連著者

• Rafi Joan

  IMEC, Kapeldreef 75, B-3001 Leuven, Belgium

• Claeys Cor

  IMEC, Kapeldreef 75, B-3001 Leuven, Belgium

• Rafí Joan

  IMEC, Kapeldreef 75, Leuven B-3001, Belgium

• Hayama Kiyoteru

  IMEC, Kapeldreef 75, Leuven B-3001, Belgium

• Mercha Abdelkarim

  IMEC, Kapeldreef 75, Leuven B-3001, Belgium

• Simoen Eddy

  IMEC, Kapeldreef 75, Leuven B-3001, Belgium

• Simoen Eddy

  IMEC, Kapeldreef 75, B-3001 Leuven, Belgium

著作論文

• Impact of Radiation-Induced Back-Channel Leakage and Back-Gate Bias on Drain Current Transients of Thin-Gate-Oxide Partially Depleted Silicon-On-Insulator n-channel Metal–Oxide–Semiconductor Field-Effect Transistors

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