Heyns M | Interuniv. Microelectronics Center Leuven Bel

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概要

• HEYNS Marc M.の詳細を見る
• 同名の論文著者
• Interuniv. Microelectronics Center Leuven Belの論文著者

関連著者

• Mertens P

  Interuniversity Microelectronics Center

• Heyns M

  Interuniv. Microelectronics Center Leuven Bel

• Heyns Marc

  Interuniversity Microelectronics Centre

• MERTENS Paul

  Interuniversitair Micro-Electronica Centrum

• BEARDA Twan

  Interuniversitary Micro-Electronics Center

• WOERLEE Pierre

  University of Twente

• Bearda T

  Interuniv. Microelectronics Center Leuven Bel

• Mertens Paul

  Interuniversity Microelectronics Center

• Heyns Marc

  Interuniversitary Micro-Electronics Center

• SCHMOLKE Rudiger

  Wacker Siltronic AG

• WALLINGA Hans

  University of Twente

• MEURIS Marc

  IMEC vzw

• Schmolke R

  Wacker Siltronic Ag

• MERTENS Paul

  IMEC

• HEYNS Marc

  IMEC

• Hatcher Zach

  Ashland Chemical

• Depas Michel

  Imec Vzw

• Gendt Stefan

  Imec Vzw

• SCHMOLKE Rudiger

  Interuniversity Microelectronics Center

• KNOTTER D.

  Philips Research

• KENIS Karine

  IMEC vzw

• MERTENS Paul

  IMEC vzw

• HEYNS Marc

  IMEC vzw

• Schmidt Harald

  IMEC

• Rotondaro Antonio

  IMEC

• Hurd Trace

  Texas Instruments

• De Gendt

  Imec Kapeldreef

• Hurd Trace

  Texas Instruments:(present Address)imec

• Meuris Marc

  Imec

• Knotter D.Martin

  Philips Research

もっと見る 閉じる

著作論文

• Current-Voltage Characteristics of Gate Oxides after Hard Breakdown
• Morphology Change of Artificial Crystal Originated Particles, and the Effect on Gate Oxide Integrity
• Breakdown and Recovery of Thin Gate Oxides
• Fabrication and Characterization of Artificial Crystal Originated Particles
• Impact of Organic Contamination on Thin Gate Oxide Quality
• H_2O_2 Decomposition and Its Impact on Silicon Surface Roughening and Gate Oxide Integrity

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