De Gendt | Imec Kapeldreef

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概要

• DE GENDT S.の詳細を見る
• 同名の論文著者
• Imec Kapeldreefの論文著者

関連著者

• De Gendt

  Imec Kapeldreef

• Roussel Ph.

  Imec Kapeldreef

• DEGRAEVE R.

  IMEC

• KAUERAUF T.

  IMEC, Kapeldreef

• DE GENDT

  IMEC, Kapeldreef

• Degraeve R.

  Imec Kapeldreef

• Kauerauf T.

  Imec Kapeldreef

• Groeseneken G.

  Imec And Also At Ku

• Ragnarsson L-a.

  Imec Kapeldreef

• GROESENEKEN G.

  IMEC

• KAUERAUF T.

  IMEC

• ZAHID M.

  John Moores University Liverpool

• BRUNCO D.

  Intel assignee at IMEC

• DE GENDT

  IMEC

• CHO M.

  IMEC, Kapeldreef

• Kaczer B.

  Imec Kapeldreef

• Mertens P

  Interuniversity Microelectronics Center

• Depas Michel

  Imec Vzw

• Heyns M

  Interuniv. Microelectronics Center Leuven Bel

• Gendt Stefan

  Imec Vzw

• KNOTTER D.

  Philips Research

• KENIS Karine

  IMEC vzw

• MEURIS Marc

  IMEC vzw

• MERTENS Paul

  IMEC vzw

• HEYNS Marc

  IMEC vzw

• CARTIER E.

  IBM Semiconductor Research and Development Center

• CHO M.

  IMEC

• KACZER B.

  IMEC

• GROESENEKEN G.

  IMEC, Kapeldreef

• DEGRAEVE R.

  IMEC, Kapeldreef

• RAGNARSSON L-A.

  IMEC, Kapeldreef

• KACZER B.

  IMEC, Kapeldreef

• ROUSSEL Ph.

  IMEC, Kapeldreef

• CRUPI F.

  University of Calabria

• HOUSSA M.

  IMEC

• KWAK D.

  Samsung Electronics c/o IMEC

• KERBER A.

  Infineon Technologies

• AUTRAN J.

  University of Provence

• POURTOIS G.

  IMEC

• PANTISANO L.

  IMEC

• HEYNS M.

  IMEC

• Heyns M.

  Imec Vzw

• De Gendt

  Imec Vzw

• Cartier E.

  Ibm

• NIWA M.

  Matsushita Electric Industrial Co., Ltd.

• MITSUHASHI R.

  Matsushita assignee at IMEC

• YAMAMOTO K.

  Matsushita assignee at IMEC

• HAYASHI S.

  Semiconductor Company, Matsushita Electric Ind., Co., Ltd.

• HARADA Y.

  Semiconductor Company, Matsushita Electric Ind., Co., Ltd.

• ROTHCHILD A.

  IMEC vzw

• HOFFMANN T.

  IMEC vzw

• KUBICEK S.

  IMEC vzw

• BIESEMANS S.

  IMEC vzw

• KUBOTA M.

  Semiconductor Company, Matsushita Electric Ind., Co., Ltd.

• Niwa M.

  Matsushita Electric Industrial Co. Ltd.

• Mitsuhashi R.

  Matsushita Ltd.

• Knotter D.Martin

  Philips Research

もっと見る 閉じる

著作論文

• Impact of Organic Contamination on Thin Gate Oxide Quality
• Degradation and Breakdown of Sub-1nm EOT HfO_2/Metal Gate Stacks
• Degradation and Breakdown of Sub-1nm EOT HfO_2/Metal Gate Stacks
• Reliability Issues in High-k Stacks
• Current Status and Addressing the Challenges of Hf-based Gate Stack toward 45nm-LSTP Application

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