Groeseneken G. | Imec And Also At Ku

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概要

• GROESENEKEN G.の詳細を見る
• 同名の論文著者
• Imec And Also At Kuの論文著者

関連著者

• Groeseneken G.

  Imec And Also At Ku

• DEGRAEVE R.

  IMEC

• Degraeve R.

  Imec Kapeldreef

• KAUERAUF T.

  IMEC, Kapeldreef

• Kauerauf T.

  Imec Kapeldreef

• Roussel Ph.

  Imec Kapeldreef

• GROESENEKEN G.

  IMEC

• DE GENDT

  IMEC, Kapeldreef

• De Gendt

  Imec Kapeldreef

• Ragnarsson L-a.

  Imec Kapeldreef

• KAUERAUF T.

  IMEC

• ZAHID M.

  John Moores University Liverpool

• BRUNCO D.

  Intel assignee at IMEC

• DE GENDT

  IMEC

• CHO M.

  IMEC, Kapeldreef

• CRUPI F.

  University of Calabria

• POURTOIS G.

  IMEC

• PANTISANO L.

  IMEC

• Kaczer B.

  Imec Kapeldreef

• Ragnarsson L.-a.

  Imec

• YU H.

  IMEC

• BIESEMANS S.

  IMEC

• CARTIER E.

  IBM Semiconductor Research and Development Center

• CHO M.

  IMEC

• KACZER B.

  IMEC

• GROESENEKEN G.

  IMEC, Kapeldreef

• DEGRAEVE R.

  IMEC, Kapeldreef

• RAGNARSSON L-A.

  IMEC, Kapeldreef

• KACZER B.

  IMEC, Kapeldreef

• ROUSSEL Ph.

  IMEC, Kapeldreef

• HOUSSA M.

  IMEC

• KWAK D.

  Samsung Electronics c/o IMEC

• KERBER A.

  Infineon Technologies

• AUTRAN J.

  University of Provence

• HEYNS M.

  IMEC

• VAN HOUDT

  IMEC vzw.

• Van Houdt

  Imec

• Cartier E.

  Ibm

• ABSIL P.

  IMEC

• NIWA M.

  Matsushita Electric Industrial Co., Ltd.

• GOVOREANU B.

  IMEC

• KAUERAUF T.

  Katholieke Universiteit Leuven, ESAT Dept.

• MAGNUS W.

  IMEC

• WELLEKENS D.

  IMEC

• GROESENEKEN G.

  Katholieke Universiteit Leuven, ESAT Dept.

• Cho H.-j.

  Samsung

• MITSUHASHI R.

  Matsushita assignee at IMEC

• CRUPI F.

  Department of Information Engineering, University of Pisa

• NIGAM T.

  IMEC

• MAES H.

  IMEC

• CHANG V.

  TSMC

• ADELMANN C.

  IMEC

• SCHRAM T.

  IMEC

• VAN DER

  IMEC and also at KU

• HARADA Y.

  Matsushita Electric Industrial Co. Ltd.

• VELOSO A.

  IMEC

• IKEDA A.

  Matsushita Ltd.

• O'connor R.

  Imec

• O'sullivan B.

  Imec

• Niwa M.

  Matsushita Electric Industrial Co. Ltd.

• Mitsuhashi R.

  Matsushita Ltd.

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著作論文

• Degradation and Breakdown of Sub-1nm EOT HfO_2/Metal Gate Stacks
• Degradation and Breakdown of Sub-1nm EOT HfO_2/Metal Gate Stacks
• Reliability Issues in High-k Stacks
• Feasibility analysis of direct tunneling through medium-κ dielectrics for embedded RAM applications
• Characteristics and Correlated Fluctuations of the Gate and Substrate Current after Oxide Soft-Breakdown
• Oxygen-Vacancy-Induced V_t shift in La-containing Devices

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