Characteristics and Correlated Fluctuations of the Gate and Substrate Current after Oxide Soft-Breakdown

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概要

• 論文の詳細を見る
• 1998-09-07

著者

• GROESENEKEN G.

  IMEC

• DEGRAEVE R.

  IMEC

• CRUPI F.

  University of Calabria

• Degraeve R.

  Imec Kapeldreef

• Groeseneken G.

  Imec And Also At Ku

• CRUPI F.

  Department of Information Engineering, University of Pisa

• NIGAM T.

  IMEC

• MAES H.

  IMEC

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