Feasibility analysis of direct tunneling through medium-κ dielectrics for embedded RAM applications

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概要

• 論文の詳細を見る
• 2005-09-13

著者

• DEGRAEVE R.

  IMEC

• KAUERAUF T.

  IMEC, Kapeldreef

• VAN HOUDT

  IMEC vzw.

• Van Houdt

  Imec

• Degraeve R.

  Imec Kapeldreef

• Kauerauf T.

  Imec Kapeldreef

• Groeseneken G.

  Imec And Also At Ku

• GOVOREANU B.

  IMEC

• KAUERAUF T.

  Katholieke Universiteit Leuven, ESAT Dept.

• MAGNUS W.

  IMEC

• WELLEKENS D.

  IMEC

• GROESENEKEN G.

  Katholieke Universiteit Leuven, ESAT Dept.

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• Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure
• Feasibility analysis of direct tunneling through medium-κ dielectrics for embedded RAM applications
• Characteristics and Correlated Fluctuations of the Gate and Substrate Current after Oxide Soft-Breakdown
• Oxygen-Vacancy-Induced V_t shift in La-containing Devices
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