CARTIER E. | IBM Semiconductor Research and Development Center
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概要
関連著者
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CARTIER E.
IBM Semiconductor Research and Development Center
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Linder B.
Ibm Semiconductor Research And Development Center
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Roussel Ph.
Imec Kapeldreef
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NARAYANAN V.
IBM Semiconductor Research and Development Center
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PARUCHURI V.
IBM Semiconductor Research and Development Center
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KANAKASABAPATHY S.
IBM Semiconductor Research and Development Center
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GROESENEKEN G.
IMEC
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DEGRAEVE R.
IMEC
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KAUERAUF T.
IMEC
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DE GENDT
IMEC
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KAUERAUF T.
IMEC, Kapeldreef
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DE GENDT
IMEC, Kapeldreef
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CRUPI F.
University of Calabria
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HOUSSA M.
IMEC
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KWAK D.
Samsung Electronics c/o IMEC
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KERBER A.
Infineon Technologies
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AUTRAN J.
University of Provence
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POURTOIS G.
IMEC
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PANTISANO L.
IMEC
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HEYNS M.
IMEC
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De Gendt
Imec Kapeldreef
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Cartier E.
Ibm Semiconductor Research And Development Center (srdc)
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Cartier E.
Ibm
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Degraeve R.
Imec Kapeldreef
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Kauerauf T.
Imec Kapeldreef
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Groeseneken G.
Imec And Also At Ku
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Paruchuri V.
Ibm Semiconductor Research & Development Center (srdc) Research Division T. J. Watson Research C
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Narayanan V.
Ibm Semiconductor Research & Development Center (srdc) Research Division T. J. Watson Research C
著作論文
- Gate First PFET Poly-Si/TiN/Al_2O_3 Gate Stacks with Inversion Thicknesses Less than 15A for High Performance or Low Power CMOS Applications
- Reliability Issues in High-k Stacks
- Towards metal gate/high-k dielectric integration for high performance CMOS technology