SCHMOLKE Rudiger | Wacker Siltronic AG
スポンサーリンク
概要
関連著者
-
SCHMOLKE Rudiger
Wacker Siltronic AG
-
Schmolke R
Wacker Siltronic Ag
-
Mertens P
Interuniversity Microelectronics Center
-
Heyns M
Interuniv. Microelectronics Center Leuven Bel
-
Heyns Marc
Interuniversity Microelectronics Centre
-
MERTENS Paul
Interuniversitair Micro-Electronica Centrum
-
BEARDA Twan
Interuniversitary Micro-Electronics Center
-
WOERLEE Pierre
University of Twente
-
Bearda T
Interuniv. Microelectronics Center Leuven Bel
-
Mertens Paul
Interuniversity Microelectronics Center
-
Heyns Marc
Interuniversitary Micro-Electronics Center
-
Graef D
Wacker Siltronic Ag
-
Kirchner Ralf
Wacker Siltronic Ag
-
Vanhellemont J
Wacker Siltronic Ag Burghausen Deu
-
Vanhellemont Jan
Wacker Siltronic Ag
-
BENDER Hugo
IMEC
-
GRAF Dieter
Wacker Siltronic AG
-
SCHAUER Reinhard
Wacker Siltronic AG
-
WERNER Norbert
Wacker Siltronic AG
-
MAYER Erwin-Peter
Wacker Siltronic AG
-
WAGNER Peter
Wacker Siltronic AG
-
SCHMOLKE Rudiger
Interuniversity Microelectronics Center
著作論文
- High Resolution Structure Imaging of Octahedral Void Defects in As-Grown Czochralski Silicon
- Observation of Extremely Low Defect Densities in Silicon Wafers
- Morphology Change of Artificial Crystal Originated Particles, and the Effect on Gate Oxide Integrity
- Fabrication and Characterization of Artificial Crystal Originated Particles