Vanhellemont Jan | Wacker Siltronic Ag
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概要
関連著者
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Vanhellemont Jan
Wacker Siltronic Ag
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Vanhellemont J
Wacker Siltronic Ag Burghausen Deu
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BENDER Hugo
IMEC
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SCHMOLKE Rudiger
Wacker Siltronic AG
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KISSINGER Gudrun
Institute for Semiconductor Physics
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LAMBERT Ulrich
Wacker Siltronic AG
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GRAF Dieter
Wacker Siltronic AG
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GRABOLLA Thomas
Institute for Semiconductor Physics
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RICHTER Hans
Institute for Semiconductor Physics
著作論文
- High Resolution Structure Imaging of Octahedral Void Defects in As-Grown Czochralski Silicon
- Conditions for the Formation of Ring-Like Distributed Stacking Faults in CZ-Si Wafers