Gaubert Philippe | New Industry Creation Hatchery Center Tohoku University
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概要
関連著者
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Gaubert Philippe
New Industry Creation Hatchery Center Tohoku University
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Teramoto Akinobu
New Industry Creation Hatchery Center (NICHe), Tohoku University, Sendai 980-8579, Japan
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Ohmi Tadahiro
New Industry Creation Hatchery Center (niche) Tohoku University
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GAUBERT Philippe
New Industry Creation Hatchery Center, Tohoku University
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TERAMOTO Akinobu
New Industry Creation Hatchery Center, Tohoku University
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SUGAWA Shigetoshi
New Industry Creation Hatchery Center, Tohoku University
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Teramoto Akinobu
New Industry Creation Hatchery Center Tohoku Univ.
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OHMI Tadahiro
World Premier International Research Center, Tohoku University
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OHMI Tadahiro
New Industry Creation Hatchery Center, Tohoku University
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Kuroda Rihito
Graduate School Of Engineering Tohoku University
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Tanaka Hiroaki
New Industry Creation Hatchery Center Tohoku University
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HAMADA Tatsufumi
Graduate School of Engineering, Tohoku University
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Teramoto Akinobu
Ulsi Laboratory Mitsubishi Electric Corporation
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Teramoto Akinobu
Department Of Electronic Engineering Faculty Of Engineering Tohoku University
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Sugawa Shigetoshi
Graduate School Of Engineering Tohoku University
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Ohmi Tadahiro
New Industry Creation Hatchery Center Future Information Industry Creation Center Tohoku University
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YAMAMOTO Masashi
New Industry Creation Hatchery Center, Tohoku University
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Yamamoto Masashi
New Industry Creation Hatchery Center Tohoku University
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Hamada Tatsufumi
Graduate School Of Engineering Tohoku University
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Teramoto Akinobu
University Of Tohoku New Industry Creation Hatchery Center (niche)
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Nakao Yukihisa
Graduate School of Engineering, Tohoku University
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Gaubert Philippe
New Industry Creation Hatchery Center, Tohoku University, Sendai 980-8579, Japan
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Nakao Yukihisa
Graduate School of Engineering, Tohoku University, Sendai 980-8579, Japan
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SUGAWA Shigetoshi
New Industry Creation Hatchery Center, Tohoku University:Graduate School of Engineering, Tohoku University
著作論文
- Low frequency noise in Si(100) and Si(110) p-channel MOSFETs (シリコン材料・デバイス)
- Analysis of the Low-Frequency Noise Reduction in Si(100) Metal--Oxide--Semiconductor Field-Effect Transistors
- Suppression of the low frequency noise level in (100) and (110) oriented silicon p-MOSFETs induced by an alkali-free cleaning process
- Hole Mobility in Accumulation Mode Metal-Oxide-Semiconductor Field-Effect Transistors (Special Issue : Solid State Devices and Materials (2))
- Noise Performance of Accumulation MOSFETs