Nakao Michinobu | Renesas Technology Corp.

スポンサーリンク

概要

• NAKAO Michinobuの詳細を見る
• 同名の論文著者
• Renesas Technology Corp.の論文著者

関連著者

• Nakao Michinobu

  Renesas Technology Corp.

• Hatayama Kazumi

  Renesas Technology Corp.

• Hatayama Kazumi

  Semiconductor & Integrated Circuits Hitachi Ltd.

• Nakao M

  Renesas Technology Corp.

• Fukumoto Satoshi

  Graduate School Of Engineering Tokyo Metropolitan University

• Iwasaki K

  Tokyo Metropolitan Univ. Hachiouji‐shi Jpn

• Iwasaki Kazuhiko

  Graduate School Of Engineering Tokyo Metropolitan University

• Sato Yoshiharu

  Graduate School of Engineering, Hokkaido University

• Fukumoto Satoshi

  Graduate School Of Engineering Hiroshima University

• Kiyoshige Yoshikazu

  Renesas Technology Corp.

• Sato Y

  Micro Device Division Hitachi Ltd.:(present Address)semiconductor Technology Academic Research Cente

• NAKAO Michinobu

  Renesas Electronics Corp.

• SATO Yasuo

  Device Development Center,Hitachi,Ltd.

• NAKAO Michinobu

  Central Research Laboratory, Hitachi, Ltd.

• KIYOSHIGE Yoshikazu

  Central Research Laboratory, Hitachi, Ltd.

• HATAYAMA Kazumi

  Central Research Laboratory, Hitachi, Ltd.

• Natsume Koichiro

  Renesas Technology Corp.

• Sato Yasuo

  Device Development Center Hitachi Ltd.

• Iwasaki Kazuhiko

  Faculty Of System Design Tokyo Metropolitan University

• Iwasaki Kazuhiko

  Faculty Of Engineering Chiba University

• NAKAO Michinobu

  Semiconductor & Integrated Circuits,Hitachi Ltd.

• HATAYAMA Kazumi

  Semiconductor & Integrated Circuits,Hitachi Ltd

• NATSUME Koichiro

  Central Research Laboratory, Hitachi Ltd.

• SATO Yasuo

  Micro Device Division, Hitachi, Ltd.

• NAGUMO Takaharu

  Enterprise Sever Division, Hitachi, Ltd.

• Nagumo Takaharu

  Enterprise Sever Division Hitachi Ltd.

• Suzuki Iwao

  Renesas Technology Corp.

• Arai Masayuki

  Faculty Of System Design Tokyo Metropolitan University

• ENDO Tatsuro

  Faculty of System Design, Tokyo Metropolitan University

• Kaneko Shun'ichi

  Hokkaido University

• Endo Tatsuro

  Faculty Of System Design Tokyo Metropolitan University

• Kiyoshige Yoshikazu

  Renesas Electronics Corporation

• SAITO Yoshikazu

  Renesas Electronics Corp.

• Matsumoto Chizu

  Yokohama Research Laboratory, Hitachi, Ltd.

• Hamamura Yuichi

  Yokohama Research Laboratory, Hitachi, Ltd.

• Yamasaki Kaname

  Renesas Electronics Corp.

もっと見る 閉じる

著作論文

• Deterministic Built-in Test for Logic Circuits Having Multiple Clocks
• High Quality Delay Test Generation Based on Multiple-Threshold Gate-Delay Fault Model(Special Issue on Test and Verification of VLSI)
• Deterministic Built-in Test with Neighborhood Pattern Generator
• Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs(Test)(VLSI Design and CAD Algorithms)
• Reduction of Area per Good Die for SoC Memory Built-In Self-Test
• Novel Fuse Scheme with a Short Repair Time to Maximize Good Chips per Wafer in Advanced SoCs

スポンサーリンク