SATO Yasuo | Device Development Center,Hitachi,Ltd.
スポンサーリンク
概要
関連著者
-
SATO Yasuo
Device Development Center,Hitachi,Ltd.
-
Sato Yasuo
Device Development Center Hitachi Ltd.
-
Sato Yoshiharu
Graduate School of Engineering, Hokkaido University
-
Hatayama Kazumi
Renesas Technology Corp.
-
Hatayama Kazumi
Semiconductor & Integrated Circuits Hitachi Ltd.
-
Sato Y
Micro Device Division Hitachi Ltd.:(present Address)semiconductor Technology Academic Research Cente
-
Iwasaki Kazuhiko
Graduate School Of Engineering Tokyo Metropolitan University
-
HATAYAMA Kazumi
Semiconductor & Integrated Circuits,Hitachi Ltd
-
Fukumoto Satoshi
Graduate School Of Engineering Tokyo Metropolitan University
-
Iwasaki K
Tokyo Metropolitan Univ. Hachiouji‐shi Jpn
-
Nakao Michinobu
Renesas Technology Corp.
-
Fukumoto Satoshi
Graduate School Of Engineering Hiroshima University
-
Nakao M
Renesas Technology Corp.
-
Sato Motoyuki
Device Development Center Hitachi Ltd.
-
TSUTSUMIDA Koki
Device Development Center, Hitachi, Ltd.
-
NOMOTO Kazuyuki
Semiconductor & Integrated Circuits, Hitachi, Ltd..
-
Tsutsumida Koki
Device Development Center Hitachi Ltd.
-
Nomoto Kazuyuki
Semiconductor & Integrated Circuits Hitachi Ltd.
-
NAKAO Michinobu
Semiconductor & Integrated Circuits,Hitachi Ltd.
-
NAKAO Michinobu
Central Research Laboratory, Hitachi, Ltd.
-
KIYOSHIGE Yoshikazu
Central Research Laboratory, Hitachi, Ltd.
-
HATAYAMA Kazumi
Central Research Laboratory, Hitachi, Ltd.
-
YAMAZAKI Iwao
Device Development Center, Hitachi, Ltd.
-
YAMANAKA Hiroki
Device Development Center, Hitachi, Ltd.
-
IKEDA Toshio
Device Development Center, Hitachi, Ltd.
-
TAKAKURA Masahiro
Design Automation Sect., Hitachi Engineering Co., Ltd.
-
Takakura Masahiro
Design Automation Sect. Hitachi Engineering Co. Ltd.
-
Kiyoshige Yoshikazu
Renesas Technology Corp.
-
Yamanaka Hiroki
Device Development Center Hitachi Ltd.
-
Yamazaki Iwao
Device Development Center Hitachi Ltd.
-
Ikeda Toshio
Device Development Center Hitachi Ltd.
著作論文
- Deterministic Built-in Test for Logic Circuits Having Multiple Clocks
- High Quality Delay Test Generation Based on Multiple-Threshold Gate-Delay Fault Model(Special Issue on Test and Verification of VLSI)
- Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration(Dependable Computing)
- DFT Timing Design Methodology for Logic BIST(Timing Verification and Test Generation)(VLSI Design and CAD Algorithms)
- DFT Timing Design Methodology for Logic BIST