Iwasaki Kazuhiko | Graduate School Of Engineering Tokyo Metropolitan University
スポンサーリンク
概要
関連著者
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Iwasaki Kazuhiko
Graduate School Of Engineering Tokyo Metropolitan University
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Fukumoto Satoshi
Graduate School Of Engineering Tokyo Metropolitan University
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Fukumoto Satoshi
Graduate School Of Engineering Hiroshima University
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ARAI Masayuki
Tokyo Metropolitan University
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IWASAKI Kazuhiko
Tokyo Metropolitan University
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Fukumoto Satoshi
Tokyo Metropolitan Univ. Hachioji‐shi Jpn
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Iwasaki K
Tokyo Metropolitan Univ. Tokyo Jpn
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Iwasaki Kazuhiko
Faculty Of System Design Tokyo Metropolitan University
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Arai Masayuki
Tokyo Metropolitan Univ. Tokyo Jpn
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ARAI Masayuki
Graduate School of Engineering, Tokyo Metropolitan University
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Arai Masayuki
Graduate School Of Engineering Tokyo Metropolitan University
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Iwasaki K
Tokyo Metropolitan Univ. Hachiouji‐shi Jpn
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SATO Yasuo
Device Development Center,Hitachi,Ltd.
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OHARA Mamoru
Graduate School of Engineering, Tokyo Metropolitan University
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KUROSU Hitoshi
Graduate School of Engineering, Tokyo Metropolitan University
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Nakao Michinobu
Renesas Technology Corp.
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Hatayama Kazumi
Renesas Technology Corp.
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Hatayama Kazumi
Semiconductor & Integrated Circuits Hitachi Ltd.
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Nakao M
Renesas Technology Corp.
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Ohara Mamoru
Graduate School Of Engineering Tokyo Metropolitan University:tokyo Metropolitan Industry Technology
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Kurosu Hitoshi
Graduate School Of Engineering Tokyo Metropolitan University
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Sato Yasuo
Device Development Center Hitachi Ltd.
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Suzuki Ryo
Graduate School Of Pharmaceutical Sciences Nagoya City Univ.
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NAKAO Michinobu
Central Research Laboratory, Hitachi, Ltd.
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KIYOSHIGE Yoshikazu
Central Research Laboratory, Hitachi, Ltd.
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HATAYAMA Kazumi
Central Research Laboratory, Hitachi, Ltd.
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YAMAGUCHI Anna
Graduate School of Engineering, Tokyo Metropolitan University
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Sato Yoshiharu
Graduate School of Engineering, Hokkaido University
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Kiyoshige Yoshikazu
Renesas Technology Corp.
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Suzuki R
Electrotechnical Lab. Ibaraki
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Suzuki R
Graduate School Of Engineering Tokyo Metropolitan University
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Yamaguchi Anna
Graduate School Of Engiueering Tokyo Metropolitan University
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Sato Y
Micro Device Division Hitachi Ltd.:(present Address)semiconductor Technology Academic Research Cente
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Suzuki Ryo
Graduate School Of Bioresources Mie University
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Youn Hee
School of Information and Communications Engineering Sungkyunkwan University
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NAKAO Michinobu
Semiconductor & Integrated Circuits,Hitachi Ltd.
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HATAYAMA Kazumi
Semiconductor & Integrated Circuits,Hitachi Ltd
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NATSUME Koichiro
Central Research Laboratory, Hitachi Ltd.
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Tsuchiya Toshio
Tokyo Metropolitan Industrial Technology Research Institute
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Yamada Kazunori
Tokyo Metropolitan Industrial Technology Research Institute
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YAMAZAKI Iwao
Device Development Center, Hitachi, Ltd.
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YAMANAKA Hiroki
Device Development Center, Hitachi, Ltd.
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IKEDA Toshio
Device Development Center, Hitachi, Ltd.
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TAKAKURA Masahiro
Design Automation Sect., Hitachi Engineering Co., Ltd.
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Takakura Masahiro
Design Automation Sect. Hitachi Engineering Co. Ltd.
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MATSUO Tatsuru
Fujitsu Laboratories Ltd.
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HIRAIDE Takahisa
Fujitsu Laboratories Ltd.
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KONISHI Hideaki
Fujitsu Ltd.
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EMORI Michiaki
Fujitsu Ltd.
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AIKYO Takashi
Fujitsu Ltd.
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Natsume Koichiro
Renesas Technology Corp.
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Youn Hee
School Of Information And Communication Engineering Sungkyunkwan University
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Yamanaka Hiroki
Device Development Center Hitachi Ltd.
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Youn Hee
School Of Electrical & Computer Engineering Sungkyunkwan University
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Yamazaki Iwao
Device Development Center Hitachi Ltd.
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Ikeda Toshio
Device Development Center Hitachi Ltd.
著作論文
- Deterministic Built-in Test for Logic Circuits Having Multiple Clocks
- High Quality Delay Test Generation Based on Multiple-Threshold Gate-Delay Fault Model(Special Issue on Test and Verification of VLSI)
- Deterministic Built-in Test with Neighborhood Pattern Generator
- Analytical Model on Hybrid State Saving with a Limited Number of Checkpoints and Bound Rollbacks(Reliability, Maintainability and Safety Analysis)
- Reliability Analysis of a Convolutional-Code-Based Packet Level FEC under Limited Buffer Size(Reliability, Maintainability and Safety Analysis)
- High-Assurance Video Conference System over the Internet(Network Systems and Applications)(Assurance Systems and Networks)
- A Technique for Constructing Dependable Internet Server Cluster(Fault Tolerance)
- C-24 Implementation and Experiments on Dependable Video Conference System
- Fault-Tolerance Design for Muiticast Using Convolutional-Code-Based FEC and Its Analytical Evaluation
- Analytical Evaluation of Internet Packet Loss Recovery Using Convolutional Codes
- Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration(Dependable Computing)
- Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate
- Study on Expansion of Convolutional Compactors over Galois Field