Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration(Dependable Computing)
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概要
- 論文の詳細を見る
Although open defects are hard to diagnose because they are unstable, we developed a technique to diagnose completely open defects. We applied a new "segment model" that takes the coupling effects on a defective node that are caused by neighboring nodes into consideration. This technique is used to focuse not only on the behavior of the defective node, but also on the behavior of other nodes affecting its behavior. We explain the theoretical treatment of our model and present experimental results obtained from an actual chip.
- 社団法人電子情報通信学会の論文
- 2004-09-01
著者
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Iwasaki Kazuhiko
Graduate School Of Engineering Tokyo Metropolitan University
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SATO Yasuo
Device Development Center,Hitachi,Ltd.
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YAMAZAKI Iwao
Device Development Center, Hitachi, Ltd.
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YAMANAKA Hiroki
Device Development Center, Hitachi, Ltd.
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IKEDA Toshio
Device Development Center, Hitachi, Ltd.
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TAKAKURA Masahiro
Design Automation Sect., Hitachi Engineering Co., Ltd.
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Takakura Masahiro
Design Automation Sect. Hitachi Engineering Co. Ltd.
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Yamanaka Hiroki
Device Development Center Hitachi Ltd.
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Yamazaki Iwao
Device Development Center Hitachi Ltd.
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Ikeda Toshio
Device Development Center Hitachi Ltd.
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Sato Yasuo
Device Development Center Hitachi Ltd.
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