Deterministic Built-in Test with Neighborhood Pattern Generator
スポンサーリンク
概要
- 論文の詳細を見る
This paper presents a new deterministic built-in test scheme using a neighbsrhood patters generator (NPG) to guarantee complete fault efficiency with small test-data storage. The NPG as a decoding logic generates both a parent pattern and deterministic child patterns within a small Hamming distance from the parent pattern. A set of test echos is encoded as a set of seeds toe the NPG. The proposed method is practically acceptable because no impact on a circuit coder test is required and the design of the NPG does not require the results of test generatics. We also describe an efficient seed generation method for the NPG. Experimental results toe benchmarh circuits demonstrate that the proposed method can significantly reduce the storage requirements when compared with other deterministic built-in test methods.
- 社団法人電子情報通信学会の論文
- 2002-05-01
著者
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Fukumoto Satoshi
Graduate School Of Engineering Tokyo Metropolitan University
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Iwasaki K
Tokyo Metropolitan Univ. Hachiouji‐shi Jpn
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Iwasaki Kazuhiko
Graduate School Of Engineering Tokyo Metropolitan University
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NAKAO Michinobu
Central Research Laboratory, Hitachi, Ltd.
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KIYOSHIGE Yoshikazu
Central Research Laboratory, Hitachi, Ltd.
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HATAYAMA Kazumi
Central Research Laboratory, Hitachi, Ltd.
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NATSUME Koichiro
Central Research Laboratory, Hitachi Ltd.
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Nakao Michinobu
Renesas Technology Corp.
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Hatayama Kazumi
Renesas Technology Corp.
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Hatayama Kazumi
Semiconductor & Integrated Circuits Hitachi Ltd.
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Natsume Koichiro
Renesas Technology Corp.
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Fukumoto Satoshi
Graduate School Of Engineering Hiroshima University
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Kiyoshige Yoshikazu
Renesas Technology Corp.
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Nakao M
Renesas Technology Corp.
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