Application of High Quality Built-in Test Using Neighborhood Pattern Generator to Industrial Designs(Test)(<Special Section>VLSI Design and CAD Algorithms)
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概要
- 論文の詳細を見る
This letter presents a practical approach for high-quality built-in test using a test pattern generator called neighborhood pattern generator (NPG) [26]. NPG is practical mainly because its structure is independent of circuit under test and it can realize high fault coverage not only for stuck-at faults but also for transition faults. Some techniques are also proposed for further improvement in practical applicability of NPG. Experimental results for large industrial circuits illustrate the efficiency of the proposed approach.
- 社団法人電子情報通信学会の論文
- 2004-12-01
著者
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Sato Yoshiharu
Graduate School of Engineering, Hokkaido University
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Nakao Michinobu
Renesas Technology Corp.
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Hatayama Kazumi
Renesas Technology Corp.
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Hatayama Kazumi
Semiconductor & Integrated Circuits Hitachi Ltd.
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Natsume Koichiro
Renesas Technology Corp.
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Kiyoshige Yoshikazu
Renesas Technology Corp.
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Nakao M
Renesas Technology Corp.
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SATO Yasuo
Micro Device Division, Hitachi, Ltd.
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NAGUMO Takaharu
Enterprise Sever Division, Hitachi, Ltd.
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Nagumo Takaharu
Enterprise Sever Division Hitachi Ltd.
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Sato Y
Micro Device Division Hitachi Ltd.:(present Address)semiconductor Technology Academic Research Cente
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Kiyoshige Yoshikazu
Renesas Electronics Corporation
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NAKAO Michinobu
Renesas Electronics Corp.
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