Kaneko Shun'ichi | Hokkaido University
スポンサーリンク
概要
関連著者
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Kaneko Shun'ichi
Hokkaido University
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Nakao Michinobu
Renesas Technology Corp.
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Lashkia Vakhtang
Okayama University Of Science
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OKURA Mitsuru
Okayama University of Science
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SAITO Yoshikazu
Renesas Electronics Corp.
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Matsumoto Chizu
Yokohama Research Laboratory, Hitachi, Ltd.
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Hamamura Yuichi
Yokohama Research Laboratory, Hitachi, Ltd.
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Yamasaki Kaname
Renesas Electronics Corp.
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NAKAO Michinobu
Renesas Electronics Corp.
著作論文
- On High Generalization Ability of Test Feature Classifiers
- Novel Fuse Scheme with a Short Repair Time to Maximize Good Chips per Wafer in Advanced SoCs