TOKUMARU Yozo | Electrotechnical Laboratory
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概要
関連著者
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TOKUMARU Yozo
Electrotechnical Laboratory
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OKUSHI Hideyo
Electrotechnical Laboratory
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MIKOSHIBA Nobuo
Electrotechnical Laboratory
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Mikoshiba Nobuo
Electrotechnica Laboratory
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KIKUCHI Makoto
Electrotechnical Laboratory
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Kikuchi Makoto
Electorotechnical Laboratory
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Okada Yasumasa
Electrotechnical Laboratory
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TANAKA Kazunobu
Electrotechnical Laboratory
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OHEDA Hidetoshi
Electrotechnical Laboratory
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OHYAMA Hideaki
Electrotechnical laboratory
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Yamasaki Satoshi
Joint Research Center For Atom Technology-national Institute For Advanced Interdisciplinary Research
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Yamasaki S
National Inst. Advanced Interdisciplinary Res. Tsukuba Jpn
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OGURA Mutsuo
Electrotechnical Laboratory
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Yamasaki S
Joint Res. Center For Atom Technol. (jrcat) Tsukuba Jpn
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Iizuka Takashi
Electrotechnical Laboratory
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Iizuka Takashi
Fujitsu Laboratories Ltd.:aset Super-fine Sr Lithography Laboratory
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ABE Takao
Shin-Etsu Handotai Company, Limited
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YAMASAKI Satoshi
Electrotechnical Laboratory
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Abe Takao
Shin-etsu Handotai
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YAMASAKI Shuichi
Superconducting Sensor Laboratory
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Tokumaru Yozo
Electrotechnical Laboratoty
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FUJISADA Hiroyuki
Electrotechnical Laboratory
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Iizuka T
Fujitsu Laboratories Ltd.:aset Super-fine Sr Lithography Laboratory
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Sakaue Katsuhiko
Electrotechnical laboratory
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0KUSHI Hideyo
Electrotechnical Laboratory
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MASUI Tsumoru
Shin-Etsu Handotai Co. Ltd.
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Okushi Hideyo
Electrotechnical Laboratoty
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Fujisada H
Electrotechnical Laboratoty
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Abe Takao
Shin-etsu Handotai Co. Ltd.
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Tokumaru Y.
Electrotechnical Laboratory
著作論文
- Determination of the Density of State Distribution of a-Si: H by Isothermal Capacitance Transient Spectroscopy
- Phase Shift Spectroscopy of Modulated Photocurrent: Its Application to Gold Levels in Crystalline Si
- Scanning Optical Fiber Microscope for High Resolution Laser Beam Induced Current Image Observation of Semiconductor Defects
- Current Saturation and Oscillation in Photosensitive GaAs
- DLTS Measurement on Au-Doped Si p^+n Junctions and Its Computer Simulation
- Properties of Silicon Doped with Nickel
- Deep Levels Associated with Nitrogen in Silicon
- A Modulated DLTS Method for Large Signal Analysis (C^2-DLTS)
- Deep Levels in n-Type Undoped and Te-doped InSb Crystals
- Electron-Beam-Induced Charge Collection Microscopy of Undoped LEC GaAs
- Isothermal Capacitance Transient Spectroscopy for Determination of Deep Level Parameters
- Current Oscillation and Light Probe Measurement of High-Field Domain Velocity in Photo-Excited High-Resistivity GaAs
- SEM-EBIC Investigations of Semi-Insulating Undoped LEC-GaAs
- Current Oscillations and High-Field Domains in Photoexcited High-Resistivity GaAs
- Helical Dislocations and Dislocation Loops in silicon Induced by Platinum Diffusion
- Switching Time and I-V Characteristic of Cu-Doped Ge Diodes
- Etch Patterns and Crystallographic Polarity in Hexagonal ZnS
- Trap-Controlled Current Oscillations in High-Resistivity n-InP
- Negative Differential Conductivity and Current Oscillation in p-CdTe
- Phase Memory Effect in Photocurrent Oscillation Due to Trap-Controlled Domain Propagation
- Characteristic Operations of High-Resistivity GaAs Oscillators
- Static N-Type Negative Differential Conductivity in Semiconductors Induced by Thermal Quenching of Photoconductivity
- Low-Frequency Photocurrent Oscillations and Trapping Levels in High-Resistivity GaAs Doped with Oxygen