Current Oscillation and Light Probe Measurement of High-Field Domain Velocity in Photo-Excited High-Resistivity GaAs
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1968-01-05
著者
-
KIKUCHI Makoto
Electrotechnical Laboratory
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TOKUMARU Yozo
Electrotechnical Laboratory
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Kikuchi Makoto
Electorotechnical Laboratory
関連論文
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- Further Experimental Results on the SOGICON Characteristics
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- Oscillation Phenomena in High Resistivity Germanium Rod
- Dependence of Acoustoelectric Current Oscillation in InSb on Azimuthal Angle of Transverse Magnetic Field
- Acoustoelectric Current Oscillation in InSb and Its Dependence on the Transverse Magnetic Field
- Sound Velocity Transit of High Field Domain in GaAs under Acoustoelectric Oscillation
- Continuous Current Oscillation in GaAs Caused by Acoustoelectric Effect
- Frequency Spectrum of Microwave Emission from GaAs
- Determination of the Density of State Distribution of a-Si: H by Isothermal Capacitance Transient Spectroscopy
- Experimental Observations of Undamped Current Oscillations in CdSe Single Crystals
- Observations of Impurity Precipitation in CdSe Single Crystals
- Observation of Current Saturation and Oscillation in CdSe Single Crystals by Local Illumination
- Observations of Oscillation in CdSe Single Crystals compensated with Cu
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- Scanning Optical Fiber Microscope for High Resolution Laser Beam Induced Current Image Observation of Semiconductor Defects
- Current Saturation and Oscillation in Photosensitive GaAs
- DLTS Measurement on Au-Doped Si p^+n Junctions and Its Computer Simulation
- Properties of Silicon Doped with Nickel
- Deep Levels Associated with Nitrogen in Silicon
- A Modulated DLTS Method for Large Signal Analysis (C^2-DLTS)
- Deep Levels in n-Type Undoped and Te-doped InSb Crystals
- Electron-Beam-Induced Charge Collection Microscopy of Undoped LEC GaAs
- Isothermal Capacitance Transient Spectroscopy for Determination of Deep Level Parameters
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- SEM-EBIC Investigations of Semi-Insulating Undoped LEC-GaAs
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- Helical Dislocations and Dislocation Loops in silicon Induced by Platinum Diffusion
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- Comments on "Endotherm in Switch-on Process in Semiconducting Glasses
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- Anomalous Etch Patterns in Highly Doped Silicon
- Infrared Observation of Anomalous Patterns in Highly Doped Silicon
- A Simlpler Method for Removing Copper from Germanium
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- Visible Light Emission from Metal-Silicon Contact
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