Namba Kazuteru | Chiba Univ. Chiba‐shi Jpn

スポンサーリンク

概要

• NAMBA Kazuteruの詳細を見る
• 同名の論文著者
• Chiba Univ. Chiba‐shi Jpnの論文著者

関連著者

• Namba Kazuteru

  Chiba Univ. Chiba‐shi Jpn

• NAMBA Kazuteru

  Graduate School of Advanced Integration Science, Chiba University

• ITO Hideo

  Graduate School of Advanced Integration Science, Chiba University

• Ito Hideo

  Chiba Univ. Chiba‐shi Jpn

• KATOH Kentaroh

  Graduate School of Science and Technology, Chiba University

• Ito Hideo

  Graduate School Of Advanced Integration Sci. Chiba Univ.

• Namba Kazuteru

  Graduate School Of Advanced Integration Sci. Chiba Univ.

• Katoh Kentaroh

  Graduate School Of Science And Technology Chiba University

• Namba Kazuteru

  Graduate School Of Advanced Integration Science Chiba University

• Ito Hideo

  Graduate School Of Advanced Integration Science Chiba University

• SBIAI Takieddine

  Graduate School of Advanced Integration Science, Chiba University

• Namba Kazuteru

  Faculty Of Engineering Chiba University

• Katoh Kentaroh

  Chiba Univ. Chiba‐shi Jpn

• Ito Hideo

  Faculty Of Engineering Chiba University

• Ito Hideo

  Chiba University

• Katoh Kentaroh

  Chiba University

もっと見る 閉じる

著作論文

• Test Compression for Robust Testable Path Delay Fault Testing Using Interleaving and Statistical Coding
• Analysis of Path Delay Fault Testability for Two-Rail Logic Circuits
• Design for Delay Fault Testability of 2-Rail Logic Circuits
• Design for Delay Fault Testability of Dual Circuits Using Master and Slave Scan Paths
• Design for Delay Fault Testability of Dual Circuits Using Master and Slave Scan Paths
• Design for Delay Fault Testability of 2-Rail Logic Circuits
• Deterministic Delay Fault BIST Using Adjacency Test Pattern Generation(Dependable Computing)
• A Dynamically Configurable NoC Test Access Mechanism
• A Dynamically Configurable NoC Test Access Mechanism (VLSI設計技術)
• Two-Stage Stuck-at Fault Test Data Compression Using Scan Flip-Flops with Delay Fault Testability

スポンサーリンク