Design for Delay Fault Testability of Dual Circuits Using Master and Slave Scan Paths

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概要

• 論文の詳細を見る

• This paper proposes a scan design for delay fault testability of dual circuits. In normal operation mode, each proposed scan flip flop operates as a master-slave flip flop. In test mode, the proposed scan design performs scan operation using two scan paths, namely master scan path and slave scan path. The master scan path consists of master latches and the slave scan path consists of slave latches. In the proposed scan design, arbitrary two-patterns can be set to flip flops of dual circuits. Therefore, it achieves complete fault coverage for robust and non-robust testable delay fault testing. It requires no extra latch unlike enhanced scan design. Thus the area overhead is low. The evaluation shows the test application time of the proposed scan design is 58.0% of that of the enhanced scan design, and the area overhead of the proposed scan design is 13.0% lower than that of the enhanced scan design. In addition, in testing of single circuits, it achieves complete fault coverage of robust and non-robust testable delay fault testing. It requires smaller test data volume than the enhanced scan design in testing of single circuits.

• （社）電子情報通信学会の論文

著者

• Namba Kazuteru

  Chiba Univ. Chiba‐shi Jpn

• NAMBA Kazuteru

  Graduate School of Advanced Integration Science, Chiba University

• ITO Hideo

  Graduate School of Advanced Integration Science, Chiba University

• KATOH Kentaroh

  Graduate School of Science and Technology, Chiba University

関連論文

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