Memory Operation and Electron Charging Characteristics of Silicon Quantum-Dot Floating-Gate MOSFETs (2001 Asia-Pacific Workshop on Fundamental and Application of Advanced Semiconductor Devices(AWAD 2001))
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概要
- 論文の詳細を見る
- 電子情報通信学会の論文
- 2001-07-05
著者
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Murakami H.
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Murakami H
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Ikeda M.
Graduate School of Advanced Sciences of Matter, Hiroshima University
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Kohno A.
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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Ikeda M.
Graduate School Of Advanced Sciences Of Matter Hiroshima University
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