Erratum: ``Switching Characterization and Failure Analysis of In2Se3 Based Phase Change Memory''
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概要
- 論文の詳細を見る
- 2012-08-25
著者
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Kang Dae-hwan
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kang Dae-Hwan
Thin Film Materials Research Center, Korea Institute of Science and Technology, Seoul 136-701, Korea
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Lee Heon
Department of Material Science and Engineering, Korea University, 5-1 Anam-dong, Sungbuk-ku, Seoul 136-701, Korea
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