Kang Dae-hwan | Thin Film Materials Research Center Korea Institute Of Science And Technology
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概要
- KANG Dae-Hwanの詳細を見る
- 同名の論文著者
- Thin Film Materials Research Center Korea Institute Of Science And Technologyの論文著者
関連著者
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Kang Dae-hwan
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Cheong Byung-ki
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Lee Kyeong
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kim Ki-bum
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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Ahn Dong-ho
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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Cheong Byung-ki
Thin Film Materials Research Center, Korea Institute of Science and Technology
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Kwon Hyuk-soon
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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Kang Dae-Hwan
Thin Film Materials Research Center, Korea Institute of Science and Technology, Seoul 136-701, Korea
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Lee Heon
Department of Material Science and Engineering, Korea University, 5-1 Anam-dong, Sungbuk-ku, Seoul 136-701, Korea
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KIM Ki-Bum
School of Life Sciences and Biotechnology, Korea University
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Kim Won
Materials Design Laboratory Koreainstitute Of Science And Technology
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Kang D‐h
Korea Inst. Of Sci. And Technol. Seoul Kor
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Kim In
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kim Ki-bum
School Of Life Sciences And Biotechnology Korea University
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Kim Won
Thin Film Materials Research Center Korea Institute Of Science And Technology
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KIM Tae-Gyun
Thin Film Materials Research Center, Korea Institute of Science and Technology
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JUNG Han-Ju
Thin Film Materials Research Center, Korea Institute of Science and Technology
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LEE Taek
Thin Film Materials Research Center, Korea Institute of Science and Technology
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AHN Dong-Ho
School of Materials Science and Engineering, Seoul National University
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KWON Min-Ho
School of Materials Science and Engineering, Seoul National University
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KWON Hyuk-Soon
School of Materials Science and Engineering, Seoul National University
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AHN Dong-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul Nationa
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KWON Min-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul Nationa
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Kim Tae-gyun
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Lee Taek
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kwon Min-ho
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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Jung Han-ju
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kwon Hyuk-soon
School Of Materials Science And Engineering Seoul National University
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Kim Ki-bum
School Of Materials Science And Engineering Seoul National University
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Kwon Min-ho
School Of Materials Science And Engineering Seoul National University
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Ahn Dong-ho
School Of Materials Science And Engineering Seoul National University
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Kwon Min-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Kang Dae-Hwan
Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1 Hawolgok-Dong, Seongbuk-Gu, Seoul 136-791, Korea
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Kang Dae-Hwan
Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1, Hawolgok-dong, Sungbuk-gu, Seoul 136-791, Korea
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Lee Min-Hyun
Department of Materials Science and Engineering, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Ahn Dong-Ho
Department of Materials Science and Engineering, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Lee Heon
Department of MSE, Korea University, 1 Anam-dong 5Ga, Sungbuk-Gu, Seoul 136-701, Korea
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Kim Ki-Bum
Department of Materials Science and Engineering, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Kim Ki-Bum
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Kim Ki-Bum
Department of Materials Science and Engineering, Seoul National University, Seoul 151-742, Korea
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Jeong Han-ju
Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1 Hawolgok-Dong, Seongbuk-Gu, Seoul 136-791, Korea
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Lee Tae-Yon
Nano Systems Institute–National Core Research Center, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Lee Dong-Bok
Department of Materials Science and Engineering, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Yim Sung-Soo
Department of Materials Science and Engineering, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Wi Jung-Sub
Department of Materials Science and Engineering, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Jin Kyung-Bae
Department of Materials Science and Engineering, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Lee Tae-Yon
Nano Systems Institute–National Core Research Center, Seoul National University, Shilim-Dong, Kwanak-Gu, Seoul 151-742, Korea
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Cheong Byung-ki
Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1 Hawolgok-Dong, Seongbuk-Gu, Seoul 136-791, Korea
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Kwon Hyuk-Soon
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Ahn Dong-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Lee Kyeong
Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1, Hawolgok-dong, Sungbuk-gu, Seoul 136-791, Korea
著作論文
- Reduction of the threshold voltage fluctuation in an electrical phase change memory device with a Ge_1Sb_2Te_4 / TiN cell structure
- Lower Voltage Operation of a Phase Change Memory Device with a Highly Resistive TiON Layer
- High Speed Phase Change Random Access Memory with (Ge1Sb2Te4)0.9(Sn1Bi2Te4)0.1 Complete Solid Solution
- Erratum: ``Switching Characterization and Failure Analysis of In2Se3 Based Phase Change Memory''
- Switching Characterization and Failure Analysis of In2Se3 Based Phase Change Memory
- Lower Voltage Operation of a Phase Change Memory Device with a Highly Resistive TiON Layer