Lee Kyeong | Thin Film Materials Research Center Korea Institute Of Science And Technology
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概要
- LEE Kyeong Seokの詳細を見る
- 同名の論文著者
- Thin Film Materials Research Center Korea Institute Of Science And Technologyの論文著者
関連著者
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Lee Kyeong
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kang Dae-hwan
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kim Ki-bum
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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Cheong Byung-ki
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Ahn Dong-ho
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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Cheong Byung-ki
Thin Film Materials Research Center, Korea Institute of Science and Technology
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Kwon Hyuk-soon
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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KIM Ki-Bum
School of Life Sciences and Biotechnology, Korea University
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Kim Won
Materials Design Laboratory Koreainstitute Of Science And Technology
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Kang D‐h
Korea Inst. Of Sci. And Technol. Seoul Kor
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Kim In
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kim Ki-bum
School Of Life Sciences And Biotechnology Korea University
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Kim Won
Thin Film Materials Research Center Korea Institute Of Science And Technology
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KIM Tae-Gyun
Thin Film Materials Research Center, Korea Institute of Science and Technology
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JUNG Han-Ju
Thin Film Materials Research Center, Korea Institute of Science and Technology
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LEE Taek
Thin Film Materials Research Center, Korea Institute of Science and Technology
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AHN Dong-Ho
School of Materials Science and Engineering, Seoul National University
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KWON Min-Ho
School of Materials Science and Engineering, Seoul National University
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KWON Hyuk-Soon
School of Materials Science and Engineering, Seoul National University
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AHN Dong-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul Nationa
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KWON Min-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul Nationa
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Kim Tae-gyun
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Lee Taek
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kwon Min-ho
Research Institute Of Advanced Materials School Of Materials Science And Engineering Seoul National
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Jung Han-ju
Thin Film Materials Research Center Korea Institute Of Science And Technology
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Kwon Hyuk-soon
School Of Materials Science And Engineering Seoul National University
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Kim Ki-bum
School Of Materials Science And Engineering Seoul National University
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Kwon Min-ho
School Of Materials Science And Engineering Seoul National University
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Ahn Dong-ho
School Of Materials Science And Engineering Seoul National University
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Kwon Min-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Kang Dae-Hwan
Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1, Hawolgok-dong, Sungbuk-gu, Seoul 136-791, Korea
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Kim Ki-Bum
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Kwon Hyuk-Soon
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Ahn Dong-Ho
Research Institute of Advanced Materials, School of Materials Science and Engineering, Seoul National University, San 56-1, Shinlim-dong, Kwanak-gu, Seoul 151-742, Korea
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Lee Kyeong
Thin Film Materials Research Center, Korea Institute of Science and Technology, 39-1, Hawolgok-dong, Sungbuk-gu, Seoul 136-791, Korea
著作論文
- Reduction of the threshold voltage fluctuation in an electrical phase change memory device with a Ge_1Sb_2Te_4 / TiN cell structure
- Lower Voltage Operation of a Phase Change Memory Device with a Highly Resistive TiON Layer
- Lower Voltage Operation of a Phase Change Memory Device with a Highly Resistive TiON Layer