Effects of Oxygen Annealing on Dielectric Properties of LuFeCuO4

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概要

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• We investigated the effect of oxygen annealing on dielectric properties of LuFeCuO4 mainly by dielectric measurements and transmission electron microscopy experiments. It was found that the leakage current density decreases with high-pressure oxygen annealing and the size of nanodomains with orientational polarization increases, which is characterized by the short-range ordering of Fe3+ and Cu2+ ions on a triangular lattice. In addition, the absolute value of relative permittivity $\varepsilon'$ decreases with oxygen annealing and $\varepsilon'$ exhibits a broad peak in the temperature window between room temperature and 550 K, which is similar to that observed in relaxor ferroelectric materials. The present experimental results suggest that the number of oxygen vacancies has a crucial effect on dielectric properties of LuFeCuO4.

• 2008-11-25

著者

• FUJIMURA Norifumi

  Graduate School of Engineering, Osaka Prefecture University

• Ikeda Naoshi

  Department Of Physics School Of Science And Engineering Waseda University

• Yoshii Kenji

  Japan Atomic Energy Research Institute

• Yoshimura Takeshi

  Graduate School Of Fisheries Sciences Hokkaido University

• SUZUKI Muneyasu

  Research Center for Advanced Science and Technology, The University of Tokyo

• Noguchi Yuji

  Research Center For Advanced Science And Technology The University Of Tokyo

• Mori Shigeo

  Graduate School Of Engineering Osaka Prefecture University

• Fujimura Norifumi

  Graduate School of Engineering, Osaka Prefecture University, Sakai 599-8531, Japan

• Matsuo Yoji

  Graduate School of Science, Osaka Prefecture University, Sakai 599-8531, Japan

• Yoshimura Takeshi

  Graduate School of Engineering, Osaka Prefecture University, Department of Applied Materials Science, 1-1 Gakuen-cho, Sakai, Osaka 599-8531, Japan

• Yoshii Kenji

  Japan Atomic Energy Agency (JAEA), Sayo, Hyogo 679-5148, Japan

• Yoshii Kenji

  Japan Atomic Energy Agency, Sayo, Hyogo 679-5248, Japan

• Ikeda Naoshi

  Department of Physics, Okayama University, Okayama 700-8530, Japan

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