Nanoscale Characterization of Domain Structures in Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub> Single Crystals Using Near-Field Raman Spectroscopy
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概要
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We have investigated domain structures in Bi<sub>4</sub>Ti<sub>3</sub>O<sub>12</sub> (BiT) single crystals by Raman scattering using scanning near-field optical microscopy (SNOM). In SNOM--Raman spectra, the polarization dependence reflects domain structures, and the spectra at the domain-wall region exhibit the splitting of the TiO<sub>6</sub> mode at ${\sim}840$ cm-1 with the appearance of additional peaks, the behavior of which is different from that observed in the single-domain region. From the resonant Raman spectra of highly deficient BiT single crystals, we find that the resonance is localized at oxygen vacancies in TiO<sub>6</sub> octahedra, and planer defects, owing to oxygen vacancies, accumulate near the domain walls, causing a strong domain pinning.
- 2011-09-25
著者
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Miyayama Masaru
Research Center For Advanced Science And Technology (rcast) The University Of Tokyo
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Noguchi Yuji
Research Center For Advanced Science And Technology The University Of Tokyo
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Kitanaka Yuuki
Research Center for Advanced Science and Technology, The University of Tokyo, 4-6-1 Komaba, Meguro, Tokyo 153-8904, Japan
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Osada Minoru
Graduate School of Advanced Science and Engineering, Waseda University, Shinjyuku, Tokyo 169-8555, Japan
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Osada Minoru
Graduate School of Advanced Science and Engineering, Waseda University, Shinjuku, Tokyo 169-8555, Japan
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Carmignano Claudia
Graduate School of Advanced Science and Engineering, Waseda University, Shinjyuku, Tokyo 169-8555, Japan
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