A New Scheme for Imaging On-Chip Dry DNA Spots using Optical/Potential Dual-Image Complementary Metal Oxide Semiconductor Sensor
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概要
- 論文の詳細を見る
A new scheme to image on-chip DNA spots using an optical/potential dual-image complementary metal oxide semiconductor (CMOS) sensor was proposed and demonstrated. Dry DNA spots have been successfully imaged without using an off-chip reference electrode. The structure of our dual-image sensor plays an essential role in the measurement method. The sensor was revealed to be capable of sensing the dielectric properties of materials placed on the sensor surface. The present measurement scheme is expected to be a powerful method for sensing dry on-chip biomolecular spots, with better compatibility with conventional slide-glass-based microarray technologies.
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2007-04-30
著者
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Nunoshita Masahiro
Graduate School Of Materials Science Nara Institute Of Science And Technology
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Ohta Jun
Graduate School Of Materials Science Nara Institute Of Science And Technology
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Kagawa Keiichiro
Graduate School Of Information Science And Technology Osaka University
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Tokuda Takashi
Graduate School Of Materials Science Nara Institute Of Science And Technology
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Kadowaki Issei
Graduate School of Materials Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 630-0192, Japan
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Nunoshita Masahiro
Graduate School of Material Science, Nara Institute of Science and Technology, 8916-5 Takayama, Ikoma, Nara 630-0101, Japan
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