Growth of Ionization Balance from F-like to Bare Ions of Heavy Atoms in an Electron Beam Ion Trap
スポンサーリンク
概要
- 論文の詳細を見る
Ionization balance from F-like to bare ions of In and I is investigated as a function of trapping time by measuring extracted ions from an electron beam ion trap, the Tokyo-EBIT. The present experiment is the first clear demonstration of the temporal behavior of the very highly charged ions that have been produced in the EBIT. The growth rate of extracted H-like ions is compared with that of the intensity of the x-ray emission resulting from radiative recombination into the K-shell of H-like ions. The absolute number density of trapped ions was estimated from the intensity of the x-ray emission.
- 社団法人 プラズマ・核融合学会の論文
著者
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YAMADA Chikashi
Institute for Laser Science, The University of Electro-Communications
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Nakamura Nobuyuki
Institute for Laser Science, University of Electro-Communications, Chofu, Tokyo 182-8585, Japan
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Ohtani Shunsuke
Institute for Laser Science (ILS), University of Electro-Communications, 1-5-1 Chofugaoka, Chofu, Tokyo 182-8585, Japan
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SUN Jian
Institute for Laser Science, The University of Electro-Communications
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WATANABE Hirofumi
Institute for Laser Science, The University of Electro-Communications
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WATANABE Hirofumi
Institute for Laser Science, University of Electro-Communications, Tokyo 182-8585, Japan
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TONA Masahide
Institute for Laser Science, University of Electro-Communications, Tokyo 182-8585, Japan
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FU Yunqing
Institute of Modern Physics, Fudan University, Shanghai 200433, People's Republic of China
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TONA Masahide
Institute for Laser Science, The University of Electro-Communications
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NAKAMURA Nobuyuki
Institute for Laser Science, The University of Electro-Communications
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FU Yunqing
Institute of Modern Physics, Fudan University, Shanghai 200433, People's Republic of China
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