New Method for Evaluating the Scaling Trend of Nano-Electro-Mechanical (NEM) Nonvolatile Memory Cells(Session 8A : Memory 2)
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概要
- 論文の詳細を見る
Finite element analysis (FEA) simulation has been performed as a new method of evaluating the scaling trend of the nano-electro-mechanical (NEM) nonvolatile memory cell. Since FEA simulation reflects the actual memory cell structure and includes nonlinear effects, it can predict program/erase operation more accurately than analytical modeling.
- 2010-06-23
著者
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Choi Woo
Department Of Electronic Engineering Sogang University
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ROH Seung
Department of Electronic Engineering, Sogang University
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Roh Seung
Department Of Electronic Engineering Sogang University
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Choi Woo
Department Of Dermatology Sanggye Paik Hospital Inje University College Of Medicine
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CHOI WOO
Department of Chemical Engineering, Doshisha University
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