High Power GaN-FET Amplifier with Reduced Memory Effects for W-CDMA Base Stations(Compound Semiconductor and Power Devices,<Special Section>Fundamentals and Applications of Advanced Semiconductor Devices)
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概要
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This paper describes a high power GaN-FET amplifier which is developed for wideband code division multiple access (W-CDMA) base stations. We design a bias network which is symmetrically arranged to the RF line (two way bias network) in order to reduce impedance at a baseband frequency of the multi-carrier W-CDMA signal. As a result, the amplifier with the two way bias network successfully suppressed memory effects. Therefore, the application of a DPD technique to the GaN-FET amplifier with the two way bias network demonstrates almost 20dB linearity improvement in IM_3 and considerable improvement in higher order IMD, resulting in low IMD of less than -50dBc at the highest ever reported W-CDMA average output power of 76W.
- 2007-05-01
著者
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Kuroda Naotaka
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Ando Yasuhiro
Ntt Telecommunications Energy Laboratories
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WAKEJIMA Akio
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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MATSUNAGA Kohji
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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ANDO Yuji
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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NAKAYAMA Tatsuo
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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OKAMOTO Yasuhiro
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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OTA Kazuki
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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TANOMURA Masahiro
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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MIYAMOTO Hironobu
Advanced HF Device R & D Center, R & D Association for Future Electron Devices
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Ando Y
Nec Corp. Otsu‐shi Jpn
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Ando Yuji
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Ando Yuji
National Institute Of Advanced Industrial Science And Technology (aist)
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Ota Kazuki
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Wakejima A
Nec Corp. Otsu‐shi Jpn
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Okamoto Y
Nec Corp. Shiga Jpn
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Okamoto Yasuhiro
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Ando Yoshiaki
Graduate School Of Science And Technology Chiba University
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Matsunaga Kohji
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Nakayama Tatsuo
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Okamoto Yasuyuki
Daioh Electric Corporation
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Tanomura Masahiro
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Ando Yasuhiro
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Nakayama T
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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Miyamoto H
Advanced Hf Device R & D Center R & D Association For Future Electron Devices:nec System Dev
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