Robust 0.13-μm Gate HJFET with Low Fringing Capacitance
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概要
- 論文の詳細を見る
- 2001-09-25
著者
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Wakejima A
Nec Corp. Otsu‐shi Jpn
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INOUE Takashi
Photonic and Wireless Devices Research Labs., NEC Corp.
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WAKEJIMA Akio
Photonic and Wireless Devices Research Laboratories, NEC Corporation
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YAMANOGUCHI Katsumi
R&D Technical Support Center, NEC Corporation
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SAMOTO Norihiko
Photonic and Wireless Devices Research Labs., NEC Corporation
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Samoto N
Kansai Electronics Research Laboratories Nec Corporation
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Yamanoguchi Katsumi
Kansai Electronics Research Laboratories Nec Corporation
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Inoue Takashi
Photonic And Wireless Devices Research Labs. Nec Corp.
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Inoue Takashi
Photonic And Wireless Devices Research Labs. Nec Corporation
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