電子プローブマイクロアナライザーを用いるテープ濾紙上の浮遊粒子状物質の元素分析

概要

論文の詳細を見る
An electron probe microanalyzer (EPMA) was applied to suspended particulate matter (SPM), hourly collected by a β-ray attenuation method SPM automatic sampler with a polytetrafluoroethylene (PTFE) tape filter, at a monitoring station in Nakahara, Kawasaki, Kanagawa, at 17 : 00 on April 13th and at 7 : 00 on April 19th, 2006. From the results, it was inferred that inorganic secondary particles were partly collected on April 13th, since N and S were detected and Asian dust was collected on April 19th, because the detected chemical elements were very similar to those of Asian dust collected in China in the past. Also, it was found that particles on a carbon-coated PTFE filter could be directly observed and analyzed by EPMA.
社団法人日本分析化学会の論文
2007-10-05