Thermal-Treatment Induced Deep Electron Traps In AlInP : Semiconductors
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2001-08-15
著者
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Huang K‐f
National Chiao Tung Univ. Hsinchu Twn
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Huang Kai-fung
Department Of Electrophysics National Chiao Tung University
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Huang Kai-feng
Department Of Electrophysics National Chiao Tung University
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Huang Kai-feng
Electrophysics Department National Chiao-tung University
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Tseng T‐y
National Chiao Tung Univ. Hsinchu Twn
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Tseng Tseung-yuen
Department Of Electronics Engineering National Chiao Tung University
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LIN Wen-Jen
Chung Shan Institute of Science and Technology
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Huang Kai-feng
Electro Physics Department National Chiao-tung University
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SUNG Wei-Jer
Department of Electrophysics, National Chiao Tung University
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Sung W‐j
Department Of Electrophysics National Chiao Tung University
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Lin Wen-jen
Chung-shan Institute Of Science And Technology
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Sung Wei-jer
Department Of Electrophysics National Chiao Tung University
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Tseng Tseung-yuen
Department Of Electronics Engineering & Institute Of Electronics National Chiao-tang University
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