Nitrogen-Doping Effects on Electrical Properties of Hydrogenated Microcrystalline Silicon as Studied by Electron Paramagnetic Resonance and Conductivity
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 2000-01-15
著者
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IKOMA Tadaaki
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University
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TERO-KUBOTA Shozo
Institute of Multidisciplinary Research for Advanced Materials (IMRAM), Tohoku University
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Tero‐kubota S
Institute Of Multidisciplinary Research For Advanced Materials Tohoku University
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Tero-kubota Shozo
Institute For Chemical Reaction Science Tohoku University
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AKIYAMA Kensuke
Kanagawa Industrial Technology Research Institute
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AKIYAMA Kimio
Institute for Chemical Reaction Science, Tohoku University
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Akiyama K
Advanced Technology R&d Center Mitsubishi Electric Corporation
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Ikoma Tadaaki
Institute Of Multidisciplinary Research For Advanced Materials (imram) Tohoku University
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Akiyama Kimio
Institute For Chemical Reaction Science Tohoku University
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EHARA Takashi
School of Science and Engineering, Ishinomaki Senshu University
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AMINO Tetsuya
School of Science and Engineering, Ishinomaki Senshu University
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SHINOMIYA Hiroyuki
School of Science and Engineering, Ishinomaki Senshu University
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Amino Tetsuya
School Of Science And Engineering Ishinomaki Senshu University
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Ehara Takashi
School Of Science And Engineering Ishinomaki Senshu University
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Shinomiya Hiroyuki
School Of Science And Engineering Ishinomaki Senshu University
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