The Effect of Temperature on Hot Electron Trapping in MOSFET's
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1983-04-20
著者
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Satoh Yoshihiro
Division of Pathology, Isehara Kyodo Hospital
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Satoh Yoshihiro
Research Center For Interface Quantum Electronics And Graduate School Of Electronics And Information
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Satoh Yoshihiro
Mitsubishi Electric Corporation
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Matsumoto Hiroshige
Institute On Industrial Science University Of Tokyo
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MATSUMOTO Heihachi
Mitsubishi Electric Corporation
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MIYAMOTO Kazutoshi
Mitsubishi Electric Corporation
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Miyamoto K
Research & Development Center Stanley Electric Co. Ltd.
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Satoh Y
Tokyo Inst. Technol. Tokyo Jpn
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Matsumoto H
Department Of Earth And Space Science Graduate School Of Science Osaka University
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Matsumoto Heihachi
Mitsubishi Electric Co. Kitaitami Works
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Satoh Y
Division Of Pathology Isehara Kyodo Hospital
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