Half-Unit Cell Growth of Bi-Sr-Ca-Cu-O Thin Films
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概要
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The growth units of superconducting Bi-Sr-Ca-Cu-O thin films were examined. The films were prepared on Y_3Al_5O_<12> (YAG) single-crystal substrates by metalorganic chemical vapor deposition (MOCVD). The growth process of the films at the initial stage was investigated by cross-sectional high-resolution transmission electron microscopy (HREM) and atomic force microscopy (AFM). We found evidence of half-unit cell growth, and the top layer of the half-unit was determined to be a Bi-O layer by angular-resolved measurement using X-ray photoelectron spectroscopy (XPS).
- 社団法人応用物理学会の論文
- 1994-10-15
著者
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TANAKA Shoji
Superconductivity Research Laboratory, International Superconductivity Technology Center
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SHIOHARA Yuh
Superconductivity Research Laboratory, ISTEC
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Shiohara Yuh
Superconductivity Research Laboratory Istec
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Shiohara Yuh
Superconducting Research Laboratory Istec
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Kubota Nobuhiko
Superconductivity Research Laboratory Istec
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Tanaka Shoji
Superconductivity Research Laboratory International Superconductivity Technology Center
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