Native Oxide Removal on Si Surfaces by NF_3-Added Hydrogen and Water Vapor Plasma Downstream Treatment
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概要
- 論文の詳細を見る
- 社団法人応用物理学会の論文
- 1994-04-30
著者
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FUJIMURA Shuzo
Basic Process Development Div.
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Kikuchi J
Axiomatic Inc. Tokyo Jpn
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KIKUCHI Jun
Manufacturing Technology Division, Fujitsu Ltd.
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FUJIMURA Shuzo
Process Development Division, Fujitsu Ltd.
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YANO Hiroshi
Manufacturing Technology Division, Fujitsu Ltd.
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IGA Masao
Manufacturing Technology Division, FUJITSU LIMITED
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OGAWA Hiroki
Basic Process Development Division, FUJITSU LIMITED
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Iga Masao
Manufacturing Technology Division Fujitsu Limited
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Fujimura Shuzo
Precess Development Division C850 Fujitsu Limited
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Fujimura Shuzo
Process Development Division Fujitsu Ltd.
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Fujimura Shuzo
Process Development Div. C850 Fujitsu Ltd.
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Kikuchi Jun
Manufacturing Technology Division Fujitsu Ltd.
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Yano H
Process And Manufacturing Engineering Center Toshiba Corporation Semiconductor Company
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Ogawa Hiroki
Basic Process Development Division Fujitsu Limited
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