嫌気条件下で交流通電したEscherichia coli B休止菌体の損傷に影響する因子

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Resing Escherichia coli B cells suspended in a phosphate buffer solution were exposed to an alternating current (AC) of 50 Hz in current density from 200 to 600 mA/cm^2 at 34±3℃ under anaerobic conditions, and the exposed cells were cultivated in a nutrient or minimal liquid medium. Total injury of exposed cell populations was evaluated by the analysis of growth delay proposed by Takano and Tsuchido.The integrated viability of exposed cells was less than the surviving fraction of cells estimated by colony counting. At a definite exposure time or current density, the integrated viability decreased with an increase in current density or exposure time, respectively. Even under conditions of definite exposure time and current density, the viability decreased with decreasing concentration of cells initially suspended in buffer solution in the exposure chamber. When exposed cells were washed with a fresh buffer solution and cultivated in a minimal medium, their viability increased markedly. Addition of yeast extract or casamino acid to a minimal medium restored the viability of exposed cells. Albumin, RNA or NAD had little recovery or protective effect.
社団法人日本生物工学会の論文
1983-11-25