Critical Fluctuation near Threshold of Gunn Instability
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概要
- 論文の詳細を見る
The low frequency noise and the oscillatory microwave power spectrum have been simultaneously measured on the Gunn diode in order to investigate the critical phenomenon near the threshold of the Gunn instability. In a rather wide bias range an anomalously large low frequency noise and a noisy power spectrum are observed. The appearance of a wide critical region is discussed with the use of an equation for the negative-resistance oscillator.
- 社団法人日本物理学会の論文
- 1976-04-15
著者
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KABASHIMA Shigeharu
Department of Applied Physics, Tokyo Institute of Technology
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Kabashima Shigeharu
Department Of Applied Physics Tokyo Institute Of Technology
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Kawakubo Tatsuyuki
Deparment Of Applied Physics Tokyo Institute Of Technology
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Yamazaki Hiroki
Department Of Applied Physics Tokyo Institute Of Technology:(present Address) Ibaragi Electrical Com
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Yamazaki Hiroki
Department Of Applied Chemistry Tokai University
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KAWAKUBO Tasuyuki
Department of Applied Physics, Tokyo Institute of Technology
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