6 原子間力顕微鏡下のエナメル質表面微細構造およびその表面性状 (例会抄録(第431回))

概要

論文の詳細を見る
We attempted to determine the ability of the atomic force microscope to observe the surface of human dental enamel and to ascertain the effect of saliva adsorption on the ultramicrostructure of the surface. Three types of enamel surface were considered in this study:1) Enamel treated with 0.1M HCI solution for 15sec, 2) Polished enamel, and 3) Polished enamel placed in saliva for two hours. The atomic force microscope (AFM) and X-ray photoelectron spectroscope (XPS) were employed to observe and analyze these sample surfaces. The AFM and XPS were able to detect the molecular structure and structural defects in the enamel crystal surface. Adsorption of salivary protein to the enamel surface masked the molecular structure and structural defects in the enamel crystal surface. The AFM technique may be useful in determining the mechanisms of carious resistance and remineralization of dental enamel.
大阪歯科学会の論文
1993-12-25