MTR-Fill : A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs
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概要
- 論文の詳細を見る
- 2008-04-01
著者
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Ahn Jin-Ho
Department of Electronic Engineering, Hoseo University
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Kang Sungho
Department of Electrical & Electronic Engineering, Yonsei University
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei University
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AHN Jin-Ho
Dept. of Electronic Eng., Hoseo University
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SONG Dong-Sup
Department of Electrical and Electronic Engineering, Yonsei University
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KIM Tae-Jin
Department of Electrical and Electronic Engineering, Yonsei University
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Song Dong-sup
Department Of Electrical And Electronic Engineering Yonsei University
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Ahn Jin-ho
Dept. Of Electronic Eng. Hoseo University
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Ahn Jin-ho
Department Of Electronic Engineering Hoseo University
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Kim Tae-jin
Department Of Electrical And Electronic Engineering Yonsei University
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Kim Tae-jin
Department Of Biology College Of Natural Sciences Kyungpook National University
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Kang Sungho
Dept. Of Electrical And Electronic Eng. Yonsei Univ.
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