An Effective Built-In Self-Test for Chargepump PLL(<Special Section>Papers Selected from AP-ASIC 2004)
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概要
- 論文の詳細を見る
In order to provide an efficient test method for PLL which is a mixed-signal circuit widely used in most of SoCs, a novel BIST method is developed. The new BIST uses the change of phase differences generated by selectively alternating the feedback frequency. It provides an efficient structural test, reduces an area overhead and improves the test accessibility.
- 2005-08-01
著者
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Kang Sungho
Department of Electrical & Electronic Engineering, Yonsei University
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Kim Hagbae
Department Of Electrical And Electronic Engineering Yonsei University
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Kim Youngyong
Department Of Electrical And Electronic Engineering Yonsei University
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HAN Junseok
Department of Electrical and Electronic Engineering, Yonsei University
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SONG Dongsup
Department of Electrical and Electronic Engineering, Yonsei University
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Han Junseok
Department Of Electrical And Electronic Engineering Yonsei University
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Song Dongsup
Department Of Electrical And Electronic Engineering Yonsei University
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