High-Contrast Imaging of Nano-Channels Using Reflection Near-Field Scanning Optical Microscope Enhanced by Optical Interference
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概要
- 論文の詳細を見る
- 2006-08-01
著者
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YOSHIMOTO Mamoru
Materials and Structures Laboratory Tokyo Institute of Technology
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SASAKI Atsushi
Materials and Structures Laboratory Tokyo Institute of Technology
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AKIBA Shusaku
Materials and Structures Laboratory, Tokyo Institute of Technology
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MATSUDA Akifumi
Materials and Structures Laboratory, Tokyo Institute of Technology
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HARA Wakana
Materials and Structures Laboratory, Tokyo Institute of Technology
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Yoshimoto Masahiro
Department Of Electronic Science And Engineering Faculty Of Engineering Kyoto University
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Yoshimoto Masahiro
Department Of Electronic Science And Engineering Kyoto University
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Yoshimoto M
Materials And Structures Laboratory Tokyo Institute Of Technology
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SAKAI Masaru
Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST)
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MONONOBE Shuji
Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST)
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SAIKI Toshiharu
Near-Field Optics Group, Kanagawa Academy of Science and Technology (KAST)
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Hara Wakana
Materials And Structures Laboratory Tokyo Institute Of Technology
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Sakai Masaru
Near-field Optics Group Kanagawa Academy Of Science And Technology (kast)
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Akiba Shusaku
Materials And Structures Laboratory Tokyo Institute Of Technology
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Mononobe Shuji
Near-field Optics Group Kanagawa Academy Of Science And Technology (kast)
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Yoshimoto M
Kyoto Inst. Technol. Kyoto Jpn
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Saiki Toshiharu
Near-field Optics Group Kanagawa Academy Of Science And Technology (kast)
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Saiki Toshiharu
Near-field Optics Group Kanagawa Academy Of Science And Technology
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Matsuda Akifumi
Materials And Structures Laboratory Tokyo Institute Of Technology
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Yoshimoto Masahiro
Department of Innovative and Engineered Materials, Tokyo Institute of Technology
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