Non Contact Atomic Force Microscope Electrical Manipulation of Carbon Nanotubes and Its Application to Fabrication of a Room Temperature Operating Single Electron Transistor
スポンサーリンク
概要
- 論文の詳細を見る
- Published by the Japan Society of Applied Physics through the Institute of Pure and Applied Physicsの論文
- 2005-04-15
著者
-
MATSUMOTO Kazuhiko
Osaka University
-
MATSUMOTO Kazuhiko
National Institute of Advanced Industrial Science and Technology (AIST)
-
Kamimura Takafumi
National Institute Of Advanced Industrial Science And Technology
-
HYON Chan
National Institute of Advanced Industrial Science and Technology
-
KOJIMA Atsuhiko
National Institute of Advanced Industrial Science and Technology
-
MAEDA Masatoshi
CREST/JST
関連論文
- 1B16-5 Label-free electrochemical biosensor based on carbon nanotubes
- n-Type Doping for Single-Walled Carbon Nanotubes by Oxygen Ion Implantation with 25eV Ultralow-Energy Ion Beam
- Fermi Level Modulation of n-type Doped Single Walled Carbon Nanotube using Buried Local-Gate FET Structure by Oxygen Ion Implantation with Ultra-low Energy Ion Beam of 25eV
- Nitrogen Doping of Single-Walled Carbon Nanotube by Using Mass-Separated Low-Energy Ion Beams
- Non Contact Atomic Force Microscope Electrical Manipulation of Carbon Nanotubes and Its Application to Fabrication of a Room Temperature Operating Single Electron Transistor
- Protein Sensor Using Carbon Nanotube Field Effect Transistor
- Growth Control of Carbon Nanotube using Various Applied Electric Fields for Electronic Device Applications
- Air Stable n-type Top Gate Carbon Nanotube Filed Effect Transistors with Silicon Nitride Insulator Deposited by Thermal Chemical Vapor Deposition
- Room-Temperature Single-Hole Transistors Made Using Semiconductor Carbon Nanotube with Artificial Defects near Carrier Depletion Region
- Gate-Induced Cross-Over between Fabry--Perot Interference and Coulomb Blockade in a Single-Walled Carbon Nanotube Transistor with Double-Gate Structure
- Reduction of Hysteresis Characteristics in Carbon Nanotube Field-Effect Transistors by Refining Process(New System Paradigms for Integrated Electronics)
- Carbon Nanotube Fabry–Perot Device for Detection of Multiple Single Charge Transitions
- n-Type Doping for Single-Walled Carbon Nanotubes by Oxygen Ion Implantation with 25 eV Ultralow-Energy Ion Beam
- Controlling Direction of Growth of Carbon Nanotubes on Patterned SiO2 Substrate
- Room-Temperature Carbon Nanotube Single-Electron Transistor with Defects Introduced by La(NO3)3 Process
- Non Contact Atomic Force Microscope Electrical Manipulation of Carbon Nanotubes and Its Application to Fabrication of a Room Temperature Operating Single Electron Transistor
- Air Stable n-type Top Gate Carbon Nanotube Filed Effect Transistors with Silicon Nitride Insulator Deposited by Thermal Chemical Vapor Deposition
- Transition between Particle Nature and Wave Nature in Single-Walled Carbon Nanotube Device
- Room-Temperature Single-Hole Transistors Made Using Semiconductor Carbon Nanotube with Artificial Defects near Carrier Depletion Region