Kamimura Takafumi | National Institute Of Advanced Industrial Science And Technology

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概要

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• 同名の論文著者
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関連著者

• Kamimura Takafumi

  National Institute Of Advanced Industrial Science And Technology

• Matsumoto Kazuhiko

  National Inst. Of Advanced Industrial Sci. And Technol. Ibaraki Jpn

• HYON Chan

  National Institute of Advanced Industrial Science and Technology

• KOJIMA Atsuhiko

  National Institute of Advanced Industrial Science and Technology

• MAEDA Masatoshi

  CREST/JST

• MATSUMOTO Kazuhiko

  Osaka University

• MATSUMOTO Kazuhiko

  National Institute of Advanced Industrial Science and Technology (AIST)

• Matsumoto Kazuhiko

  National Institute Of Advanced Industrial Science And Technology

• Ohno Yasuhide

  Core Research for Evolutional Science and Technology, 5 Sanbancho, Chiyoda-ku, Tokyo 102-0075, Japan

• Matsumoto Kazuhiko

  National Institute of Advanced Industrial Science and Technology, Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

• Matsumoto Kazuhiko

  National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

• Ohno Yasuhide

  ISIR, Osaka University, 8-1 Mihogaoka, Ibaraki, Osaka 567-0047, Japan

• Kamimura Takafumi

  National Institute of Advanced Industrial Science and Technology, Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

• Kamimura Takafumi

  National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

• Kamimura Takafumi

  National Institute of Advanced Industrial Science and Technology, 1-1-1 Umezono Tsukuba, Ibaraki 305-8568, Japan

• Hyon Chan

  National Institute of Advanced Industrial Science and Technology, Central 2, 1-1-1 Umezono, Tsukuba, Ibaraki 305-8568, Japan

• Maeda Masatoshi

  CREST, Japan Science and Technology Agency, 4-1-8 Honcho Kawaguchi, Saitama 332-0012, Japan

• Maeda Masatoshi

  CREST/JST, 4-1-8 Honcho, Kawaguchi, Saitama 332-0012, Japan

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著作論文

• Non Contact Atomic Force Microscope Electrical Manipulation of Carbon Nanotubes and Its Application to Fabrication of a Room Temperature Operating Single Electron Transistor
• Gate-Induced Cross-Over between Fabry--Perot Interference and Coulomb Blockade in a Single-Walled Carbon Nanotube Transistor with Double-Gate Structure
• Carbon Nanotube Fabry–Perot Device for Detection of Multiple Single Charge Transitions
• Controlling Direction of Growth of Carbon Nanotubes on Patterned SiO2 Substrate
• Non Contact Atomic Force Microscope Electrical Manipulation of Carbon Nanotubes and Its Application to Fabrication of a Room Temperature Operating Single Electron Transistor
• Transition between Particle Nature and Wave Nature in Single-Walled Carbon Nanotube Device

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